CompTIA DataX DY0-001 (V1) Practice Question

During development of an industrial defect-inspection pipeline you learn that, for each new product variant, manufacturing can supply only a single defect-free reference image. The model must then accept or reject future images as belonging to that variant without full retraining whenever a new variant appears. A large archive of labeled images from thousands of earlier variants is available for offline training.

Which approach BEST meets this one-shot learning requirement?

  • Fine-tune the final layer of a pretrained convolutional classifier on the single photo of each new variant while freezing earlier layers.

  • Train a Siamese or prototypical network with contrastive/triplet loss to learn an embedding space, then classify each new variant by nearest-neighbor distance to its single reference image.

  • Apply k-means clustering on raw pixel intensities of all images-including the new variant-and use the resulting cluster IDs as labels.

  • Generate random crops and flips of the single reference image to create a larger synthetic dataset, then retrain a soft-max classifier from scratch.

CompTIA DataX DY0-001 (V1)
Machine Learning
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